Interferometric Visibility Modulation for Advanced Quantum Characterization

Interferometric Visibility Modulation for Advanced Quantum Characterization

Quantum interference lies at the heart of emerging quantum technologies. Our use case proposes an innovative statistical framework for characterizing quantum light sources through controlled visibility modulation within interferometric setups.

What We Offer:

• A simplified yet powerful double-slit or SLM-based architecture to observe subtle interference visibility shifts (ΔV).

• Passive modulation of coherence on one path of entangled photon pairs.

• High-resolution statistical detection using off-the-shelf CMOS or ICCD cameras.

• Data analysis via Fourier transforms or machine learning for high sensitivity.

Why It Matters:

• Characterizes entangled light sources with greater efficiency and clarity.

• Enables testing of slit geometries, encoding protocols, and photon source behaviors.

• Supports reproducible benchmarking of entangled visibility performance across labs.

• Opens the door to novel methods for quantum imaging, sensing, and signal analysis.

Applications:

• Quantum light source benchmarking

• Quantum optics protocol development

• Quantum imaging and passive coherence studies

• Integration with QKD, SPDC, or quantum dot emitter platforms